| |
| 2001 | ||
|---|---|---|
| 1 | B. Lambert, N. Malbert, N. Labat, F. Verdier, A. Touboul, P. Huguet, R. Bonnet, G. Pataut: Evolution of LF noise in Power PHEMT's submitted to RF and DC Step Stresses. Microelectronics Reliability 41(9-10): 1573-1578 (2001) | |
| 1 | R. Bonnet | [1] |
| 2 | N. Labat | [1] |
| 3 | B. Lambert | [1] |
| 4 | N. Malbert | [1] |
| 5 | G. Pataut | [1] |
| 6 | A. Touboul | [1] |
| 7 | F. Verdier | [1] |