| 2006 |
|---|
| 3 | EE | A. M. Albadri,
R. D. Schrimpf,
K. F. Galloway,
D. G. Walker:
Single event burnout in power diodes: Mechanisms and models.
Microelectronics Reliability 46(2-4): 317-325 (2006) |
| 2005 |
|---|
| 2 | EE | P. C. Adell,
R. D. Schrimpf,
C. R. Cirba,
W. T. Holman,
X. Zhu,
H. J. Barnaby,
O. Mion:
Single event transient effects in a voltage reference.
Microelectronics Reliability 45(2): 355-359 (2005) |
| 2001 |
|---|
| 1 | EE | D. G. Walker,
T. S. Fisher,
J. Liu,
R. D. Schrimpf:
Thermal modeling of single event burnout failure in semiconductor power devices.
Microelectronics Reliability 41(4): 571-578 (2001) |
