K. F. Galloway
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2006
1
EE
A. M. Albadri
,
R. D. Schrimpf
, K. F. Galloway,
D. G. Walker
: Single event burnout in power diodes: Mechanisms and models.
Microelectronics Reliability 46
(2-4): 317-325 (2006)
Coauthor
Index
1
A. M. Albadri
[
1
]
2
R. D. Schrimpf
[
1
]
3
D. G. Walker
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
