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O. Mion

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2005
1EEP. C. Adell, R. D. Schrimpf, C. R. Cirba, W. T. Holman, X. Zhu, H. J. Barnaby, O. Mion: Single event transient effects in a voltage reference. Microelectronics Reliability 45(2): 355-359 (2005)

Coauthor Index

1P. C. Adell [1]
2H. J. Barnaby [1]
3C. R. Cirba [1]
4W. T. Holman [1]
5R. D. Schrimpf [1]
6X. Zhu [1]

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