| |
| 2006 | ||
|---|---|---|
| 2 | EE | A. M. Albadri, R. D. Schrimpf, K. F. Galloway, D. G. Walker: Single event burnout in power diodes: Mechanisms and models. Microelectronics Reliability 46(2-4): 317-325 (2006) |
| 2001 | ||
| 1 | EE | D. G. Walker, T. S. Fisher, J. Liu, R. D. Schrimpf: Thermal modeling of single event burnout failure in semiconductor power devices. Microelectronics Reliability 41(4): 571-578 (2001) |
| 1 | A. M. Albadri | [2] |
| 2 | T. S. Fisher | [1] |
| 3 | K. F. Galloway | [2] |
| 4 | J. Liu | [1] |
| 5 | R. D. Schrimpf | [1] [2] |