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A. M. Albadri

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2006
1EEA. M. Albadri, R. D. Schrimpf, K. F. Galloway, D. G. Walker: Single event burnout in power diodes: Mechanisms and models. Microelectronics Reliability 46(2-4): 317-325 (2006)

Coauthor Index

1K. F. Galloway [1]
2R. D. Schrimpf [1]
3D. G. Walker [1]

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