| |
| 2005 | ||
|---|---|---|
| 1 | EE | P. C. Adell, R. D. Schrimpf, C. R. Cirba, W. T. Holman, X. Zhu, H. J. Barnaby, O. Mion: Single event transient effects in a voltage reference. Microelectronics Reliability 45(2): 355-359 (2005) |
| 1 | P. C. Adell | [1] |
| 2 | H. J. Barnaby | [1] |
| 3 | W. T. Holman | [1] |
| 4 | O. Mion | [1] |
| 5 | R. D. Schrimpf | [1] |
| 6 | X. Zhu | [1] |