2005 | ||
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2 | EE | P. C. Adell, R. D. Schrimpf, C. R. Cirba, W. T. Holman, X. Zhu, H. J. Barnaby, O. Mion: Single event transient effects in a voltage reference. Microelectronics Reliability 45(2): 355-359 (2005) |
2002 | ||
1 | EE | R. D. Newbould, Jo Dale Carothers, J. J. Rodriguez, W. T. Holman: A hierarchy of physical design watermarking schemes for intellectual property protection of IC designs. ISCAS (4) 2002: 862-865 |
1 | P. C. Adell | [2] |
2 | H. J. Barnaby | [2] |
3 | Jo Dale Carothers | [1] |
4 | C. R. Cirba | [2] |
5 | O. Mion | [2] |
6 | R. D. Newbould | [1] |
7 | J. J. Rodriguez | [1] |
8 | R. D. Schrimpf | [2] |
9 | X. Zhu | [2] |