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| 2005 | ||
|---|---|---|
| 2 | EE | P. C. Adell, R. D. Schrimpf, C. R. Cirba, W. T. Holman, X. Zhu, H. J. Barnaby, O. Mion: Single event transient effects in a voltage reference. Microelectronics Reliability 45(2): 355-359 (2005) |
| 2002 | ||
| 1 | EE | R. D. Newbould, Jo Dale Carothers, J. J. Rodriguez, W. T. Holman: A hierarchy of physical design watermarking schemes for intellectual property protection of IC designs. ISCAS (4) 2002: 862-865 |
| 1 | P. C. Adell | [2] |
| 2 | H. J. Barnaby | [2] |
| 3 | Jo Dale Carothers | [1] |
| 4 | C. R. Cirba | [2] |
| 5 | O. Mion | [2] |
| 6 | R. D. Newbould | [1] |
| 7 | J. J. Rodriguez | [1] |
| 8 | R. D. Schrimpf | [2] |
| 9 | X. Zhu | [2] |