T. S. Fisher
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2001
1
EE
D. G. Walker
, T. S. Fisher,
J. Liu
,
R. D. Schrimpf
: Thermal modeling of single event burnout failure in semiconductor power devices.
Microelectronics Reliability 41
(4): 571-578 (2001)
Coauthor
Index
1
J. Liu
[
1
]
2
R. D. Schrimpf
[
1
]
3
D. G. Walker
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
