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| 2005 | ||
|---|---|---|
| 1 | EE | Yannick Rey-Tauriac, J. Badoc, B. Reynard, R. A. Bianchi, D. Lachenal, A. Bravaix: Hot-carrier reliability of 20V MOS transistors in 0.13 mum CMOS technology. Microelectronics Reliability 45(9-11): 1349-1354 (2005) |
| 1 | J. Badoc | [1] |
| 2 | R. A. Bianchi | [1] |
| 3 | A. Bravaix | [1] |
| 4 | D. Lachenal | [1] |
| 5 | Yannick Rey-Tauriac | [1] |