| |
| 2005 | ||
|---|---|---|
| 1 | EE | M. A. Exarchos, G. J. Papaioannou, J. Jomaah, F. Balestra: The impact of static and dynamic degradation on SOI "smart-cut" floating body MOSFETs. Microelectronics Reliability 45(9-11): 1386-1389 (2005) |
| 1 | F. Balestra | [1] |
| 2 | J. Jomaah | [1] |
| 3 | G. J. Papaioannou | [1] |