| |
| 2005 | ||
|---|---|---|
| 2 | EE | X. Blasco, M. Nafría, X. Aymerich, J. Pétry, Wilfried Vandervorst: Breakdown spots of ultra-thin (EOT<1.5nm) HfO2/SiO2 stacks observed with enhanced - CAFM. Microelectronics Reliability 45(5-6): 811-814 (2005) |
| 1 | EE | J. Pétry, Wilfried Vandervorst, L. Pantisano, Robin Degraeve: On the data interpretation of the C-AFM measurements in the characterization of thin insulating layers. Microelectronics Reliability 45(5-6): 815-818 (2005) |
| 1 | X. Aymerich | [2] |
| 2 | X. Blasco | [2] |
| 3 | Robin Degraeve | [1] |
| 4 | M. Nafría | [2] |
| 5 | L. Pantisano | [1] |
| 6 | Wilfried Vandervorst | [1] [2] |