| 2002 |
|---|
| 4 | EE | Kazumi Hatayama,
Michinobu Nakao,
Yoshikazu Kiyoshige,
Koichiro Natsume,
Yasuo Sato,
Takaharu Nagumo:
Application of High-Quality Built-In Test to Industrial Designs.
ITC 2002: 1003-1012 |
| 2001 |
|---|
| 3 | EE | Michinobu Nakao,
Yoshikazu Kiyoshige,
Kazumi Hatayama,
Yasuo Sato,
Takaharu Nagumo:
Test Generation for Multiple-Threshold Gate-Delay Fault Model.
Asian Test Symposium 2001: 244- |
| 2000 |
|---|
| 2 | | Yasuo Sato,
Toyohito Ikeya,
Machinobu Nakao,
Takaharu Nagumo:
A BIST approach for very deep sub-micron (VDSM) defects.
ITC 2000: 283-291 |
| 1994 |
|---|
| 1 | EE | Takaharu Nagumo,
Masahiko Nagai,
Takao Nishida,
Masayuki Miyoshi,
Shunsuke Miyamoto:
VFSIM: Vectorized Fault Simulator Using a Reduction Technique Excluding Temporarily Unobservable Faults.
DAC 1994: 510-515 |
