Machinobu Nakao
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2000
1
Yasuo Sato
,
Toyohito Ikeya
, Machinobu Nakao,
Takaharu Nagumo
: A BIST approach for very deep sub-micron (VDSM) defects.
ITC 2000
: 283-291
Coauthor
Index
1
Toyohito Ikeya
[
1
]
2
Takaharu Nagumo
[
1
]
3
Yasuo Sato
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
