| |
| 2002 | ||
|---|---|---|
| 1 | EE | Kazumi Hatayama, Michinobu Nakao, Yoshikazu Kiyoshige, Koichiro Natsume, Yasuo Sato, Takaharu Nagumo: Application of High-Quality Built-In Test to Industrial Designs. ITC 2002: 1003-1012 |
| 1 | Kazumi Hatayama | [1] |
| 2 | Yoshikazu Kiyoshige | [1] |
| 3 | Takaharu Nagumo | [1] |
| 4 | Michinobu Nakao | [1] |
| 5 | Yasuo Sato | [1] |