Yoshikazu Kiyoshige

2002
2	EE	Kazumi Hatayama, Michinobu Nakao, Yoshikazu Kiyoshige, Koichiro Natsume, Yasuo Sato, Takaharu Nagumo: Application of High-Quality Built-In Test to Industrial Designs. ITC 2002: 1003-1012
2001
1	EE	Michinobu Nakao, Yoshikazu Kiyoshige, Kazumi Hatayama, Yasuo Sato, Takaharu Nagumo: Test Generation for Multiple-Threshold Gate-Delay Fault Model. Asian Test Symposium 2001: 244-

Coauthor Index

1	Kazumi Hatayama	[1] [2]
2	Takaharu Nagumo	[1] [2]
3	Michinobu Nakao	[1] [2]
4	Koichiro Natsume	[2]
5	Yasuo Sato	[1] [2]