| |
| 2005 | ||
|---|---|---|
| 1 | EE | N. Ismail, N. Malbert, N. Labat, A. Touboul, J. L. Muraro, F. Brasseau, D. Langrez: Safe operating area of GaAs MESFET and PHEMT for amplification in overdrive operating conditions. Microelectronics Reliability 45(9-11): 1611-1616 (2005) |
| 1 | N. Ismail | [1] |
| 2 | N. Labat | [1] |
| 3 | D. Langrez | [1] |
| 4 | N. Malbert | [1] |
| 5 | J. L. Muraro | [1] |
| 6 | A. Touboul | [1] |