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F. Brasseau

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2005
1EEN. Ismail, N. Malbert, N. Labat, A. Touboul, J. L. Muraro, F. Brasseau, D. Langrez: Safe operating area of GaAs MESFET and PHEMT for amplification in overdrive operating conditions. Microelectronics Reliability 45(9-11): 1611-1616 (2005)

Coauthor Index

1N. Ismail [1]
2N. Labat [1]
3D. Langrez [1]
4N. Malbert [1]
5J. L. Muraro [1]
6A. Touboul [1]

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