2005 | ||
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1 | EE | N. Ismail, N. Malbert, N. Labat, A. Touboul, J. L. Muraro, F. Brasseau, D. Langrez: Safe operating area of GaAs MESFET and PHEMT for amplification in overdrive operating conditions. Microelectronics Reliability 45(9-11): 1611-1616 (2005) |
1 | F. Brasseau | [1] |
2 | N. Ismail | [1] |
3 | N. Labat | [1] |
4 | N. Malbert | [1] |
5 | J. L. Muraro | [1] |
6 | A. Touboul | [1] |