| 2005 |
|---|
| 4 | EE | Masayasu Fukunaga,
Seiji Kajihara,
Sadami Takeoka:
On Statistical Estimation of Fault Efficiency for Path Delay Faults Based on Untestable Path Analysis.
IEICE Transactions 88-D(7): 1671-1677 (2005) |
| 2003 |
|---|
| 3 | EE | Masayasu Fukunaga,
Seiji Kajihara,
Sadami Takeoka:
On Estimation of Fault Efficiency for Path Delay Faults.
Asian Test Symposium 2003: 64-67 |
| 2000 |
|---|
| 2 | | Sudhakar M. Reddy,
Irith Pomeranz,
Seiji Kajihara,
Atsushi Murakami,
Sadami Takeoka,
Mitsuyasu Ohta:
On validating data hold times for flip-flops in sequential circuits.
ITC 2000: 317-325 |
| 1995 |
|---|
| 1 | EE | Akira Motohara,
Sadami Takeoka,
Toshinori Hosokawa,
Mitsuyasu Ohta,
Yuji Takai,
Michihiro Matsumoto,
Michiaki Muraoka:
Design for testability using register-transfer level partial scan selection.
ASP-DAC 1995 |
