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M. Modreanu

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2005
3EEJ. M. Decams, H. Guillon, C. Jiménez, M. Audier, J. P. Sénateur, C. Dubourdieu, O. Cadix, B. J. O'Sullivan, M. Modreanu, P. K. Hurley: Electrical characterization of HfO2 films obtained by UV assisted injection MOCVD. Microelectronics Reliability 45(5-6): 929-932 (2005)
2EEQ. Fang, I. Liaw, M. Modreanu, P. K. Hurley, I. W. Boyd: Post deposition UV-induced O2 annealing of HfO2 thin films. Microelectronics Reliability 45(5-6): 957-960 (2005)
1EEE. Halova, S. Alexandrova, A. Szekeres, M. Modreanu: LPCVD-silicon oxynitride films: interface properties. Microelectronics Reliability 45(5-6): 982-985 (2005)

Coauthor Index

1S. Alexandrova [1]
2M. Audier [3]
3I. W. Boyd [2]
4O. Cadix [3]
5J. M. Decams [3]
6C. Dubourdieu [3]
7Q. Fang [2]
8H. Guillon [3]
9E. Halova [1]
10P. K. Hurley [2] [3]
11C. Jiménez [3]
12I. Liaw [2]
13B. J. O'Sullivan [3]
14J. P. Sénateur [3]
15A. Szekeres [1]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)