M. Modreanu

2005
3	EE	J. M. Decams, H. Guillon, C. Jiménez, M. Audier, J. P. Sénateur, C. Dubourdieu, O. Cadix, B. J. O'Sullivan, M. Modreanu, P. K. Hurley: Electrical characterization of HfO2 films obtained by UV assisted injection MOCVD. Microelectronics Reliability 45(5-6): 929-932 (2005)
2	EE	Q. Fang, I. Liaw, M. Modreanu, P. K. Hurley, I. W. Boyd: Post deposition UV-induced O2 annealing of HfO2 thin films. Microelectronics Reliability 45(5-6): 957-960 (2005)
1	EE	E. Halova, S. Alexandrova, A. Szekeres, M. Modreanu: LPCVD-silicon oxynitride films: interface properties. Microelectronics Reliability 45(5-6): 982-985 (2005)

Coauthor Index

1	S. Alexandrova	[1]
2	M. Audier	[3]
3	I. W. Boyd	[2]
4	O. Cadix	[3]
5	J. M. Decams	[3]
6	C. Dubourdieu	[3]
7	Q. Fang	[2]
8	H. Guillon	[3]
9	E. Halova	[1]
10	P. K. Hurley	[2] [3]
11	C. Jiménez	[3]
12	I. Liaw	[2]
13	B. J. O'Sullivan	[3]
14	J. P. Sénateur	[3]
15	A. Szekeres	[1]

Colors in the list of coauthors