2005 | ||
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1 | EE | J. M. Decams, H. Guillon, C. Jiménez, M. Audier, J. P. Sénateur, C. Dubourdieu, O. Cadix, B. J. O'Sullivan, M. Modreanu, P. K. Hurley: Electrical characterization of HfO2 films obtained by UV assisted injection MOCVD. Microelectronics Reliability 45(5-6): 929-932 (2005) |
1 | M. Audier | [1] |
2 | O. Cadix | [1] |
3 | C. Dubourdieu | [1] |
4 | H. Guillon | [1] |
5 | P. K. Hurley | [1] |
6 | C. Jiménez | [1] |
7 | M. Modreanu | [1] |
8 | B. J. O'Sullivan | [1] |
9 | J. P. Sénateur | [1] |