M. Audier

2005
2	EE	J. M. Decams, H. Guillon, C. Jiménez, M. Audier, J. P. Sénateur, C. Dubourdieu, O. Cadix, B. J. O'Sullivan, M. Modreanu, P. K. Hurley: Electrical characterization of HfO2 films obtained by UV assisted injection MOCVD. Microelectronics Reliability 45(5-6): 929-932 (2005)
1	EE	A. Sibai, S. Lhostis, Y. Rozier, O. Salicio, S. Amtablian, C. Dubois, J. Legrand, J. P. Sénateur, M. Audier, L. Hubert-Pfalzgraff: Characterization of crystalline MOCVD SrTiO3 films on SiO2/Si(100). Microelectronics Reliability 45(5-6): 941-944 (2005)

Coauthor Index

1	S. Amtablian	[1]
2	O. Cadix	[2]
3	J. M. Decams	[2]
4	C. Dubois	[1]
5	C. Dubourdieu	[2]
6	H. Guillon	[2]
7	L. Hubert-Pfalzgraff	[1]
8	P. K. Hurley	[2]
9	C. Jiménez	[2]
10	J. Legrand	[1]
11	S. Lhostis	[1]
12	M. Modreanu	[2]
13	B. J. O'Sullivan	[2]
14	Y. Rozier	[1]
15	O. Salicio	[1]
16	J. P. Sénateur	[1] [2]
17	A. Sibai	[1]