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B. J. O'Sullivan

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2005
2EEJ. M. Decams, H. Guillon, C. Jiménez, M. Audier, J. P. Sénateur, C. Dubourdieu, O. Cadix, B. J. O'Sullivan, M. Modreanu, P. K. Hurley: Electrical characterization of HfO2 films obtained by UV assisted injection MOCVD. Microelectronics Reliability 45(5-6): 929-932 (2005)
2001
1EEB. J. O'Sullivan, P. K. Hurley, F. N. Cubaynes, P. A. Stolk, F. P. Widdershoven: Flat band voltage shift and oxide properties after rapid thermal annealing. Microelectronics Reliability 41(7): 1053-1056 (2001)

Coauthor Index

1M. Audier [2]
2O. Cadix [2]
3F. N. Cubaynes [1]
4J. M. Decams [2]
5C. Dubourdieu [2]
6H. Guillon [2]
7P. K. Hurley [1] [2]
8C. Jiménez [2]
9M. Modreanu [2]
10J. P. Sénateur [2]
11P. A. Stolk [1]
12F. P. Widdershoven [1]

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