B. J. O'Sullivan

2005
2	EE	J. M. Decams, H. Guillon, C. Jiménez, M. Audier, J. P. Sénateur, C. Dubourdieu, O. Cadix, B. J. O'Sullivan, M. Modreanu, P. K. Hurley: Electrical characterization of HfO2 films obtained by UV assisted injection MOCVD. Microelectronics Reliability 45(5-6): 929-932 (2005)
2001
1	EE	B. J. O'Sullivan, P. K. Hurley, F. N. Cubaynes, P. A. Stolk, F. P. Widdershoven: Flat band voltage shift and oxide properties after rapid thermal annealing. Microelectronics Reliability 41(7): 1053-1056 (2001)

Coauthor Index

1	M. Audier	[2]
2	O. Cadix	[2]
3	F. N. Cubaynes	[1]
4	J. M. Decams	[2]
5	C. Dubourdieu	[2]
6	H. Guillon	[2]
7	P. K. Hurley	[1] [2]
8	C. Jiménez	[2]
9	M. Modreanu	[2]
10	J. P. Sénateur	[2]
11	P. A. Stolk	[1]
12	F. P. Widdershoven	[1]