J. P. Sénateur

2005
2	EE	J. M. Decams, H. Guillon, C. Jiménez, M. Audier, J. P. Sénateur, C. Dubourdieu, O. Cadix, B. J. O'Sullivan, M. Modreanu, P. K. Hurley: Electrical characterization of HfO2 films obtained by UV assisted injection MOCVD. Microelectronics Reliability 45(5-6): 929-932 (2005)
1	EE	A. Sibai, S. Lhostis, Y. Rozier, O. Salicio, S. Amtablian, C. Dubois, J. Legrand, J. P. Sénateur, M. Audier, L. Hubert-Pfalzgraff: Characterization of crystalline MOCVD SrTiO3 films on SiO2/Si(100). Microelectronics Reliability 45(5-6): 941-944 (2005)

Coauthor Index

1	S. Amtablian	[1]
2	M. Audier	[1] [2]
3	O. Cadix	[2]
4	J. M. Decams	[2]
5	C. Dubois	[1]
6	C. Dubourdieu	[2]
7	H. Guillon	[2]
8	L. Hubert-Pfalzgraff	[1]
9	P. K. Hurley	[2]
10	C. Jiménez	[2]
11	J. Legrand	[1]
12	S. Lhostis	[1]
13	M. Modreanu	[2]
14	B. J. O'Sullivan	[2]
15	Y. Rozier	[1]
16	O. Salicio	[1]
17	A. Sibai	[1]