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1996 | ||
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2 | Piero Franco, Siyad C. Ma, Jonathan Chang, Yi-Chin Chu, Sanjay Wattal, Edward J. McCluskey, Robert L. Stokes, William D. Farwell: Analysis and Detection of Timing Failures in an Experimental Test Chip. ITC 1996: 691-700 | |
1995 | ||
1 | Piero Franco, William D. Farwell, Robert L. Stokes, Edward J. McCluskey: An Experimental Chip to Evaluate Test Techniques: Chip and Experiment Design. ITC 1995: 653-662 |
1 | Jonathan Chang | [2] |
2 | Yi-Chin Chu | [2] |
3 | William D. Farwell | [1] [2] |
4 | Piero Franco | [1] [2] |
5 | Siyad C. Ma | [2] |
6 | Edward J. McCluskey | [1] [2] |
7 | Sanjay Wattal | [2] |