2007 |
10 | EE | David I. August,
Jonathan Chang,
Sylvain Girbal,
Daniel Gracia Pérez,
Gilles Mouchard,
David A. Penry,
Olivier Temam,
Neil Vachharajani:
UNISIM: An Open Simulation Environment and Library for Complex Architecture Design and Collaborative Development.
Computer Architecture Letters 6(2): 45-48 (2007) |
9 | EE | George A. Reis,
Jonathan Chang,
David I. August:
Automatic Instruction-Level Software-Only Recovery.
IEEE Micro 27(1): 36-47 (2007) |
2006 |
8 | EE | Bolei Guo,
Youfeng Wu,
Cheng Wang,
Matthew J. Bridges,
Guilherme Ottoni,
Neil Vachharajani,
Jonathan Chang,
David I. August:
Selective Runtime Memory Disambiguation in a Dynamic Binary Translator.
CC 2006: 65-79 |
7 | EE | Jonathan Chang,
George A. Reis,
David I. August:
Automatic Instruction-Level Software-Only Recovery.
DSN 2006: 83-92 |
2005 |
6 | EE | George A. Reis,
Jonathan Chang,
Neil Vachharajani,
Ram Rangan,
David I. August:
SWIFT: Software Implemented Fault Tolerance.
CGO 2005: 243-254 |
5 | EE | George A. Reis,
Jonathan Chang,
Neil Vachharajani,
Ram Rangan,
David I. August,
Shubhendu S. Mukherjee:
Design and Evaluation of Hybrid Fault-Detection Systems.
ISCA 2005: 148-159 |
4 | EE | George A. Reis,
Jonathan Chang,
Neil Vachharajani,
Ram Rangan,
David I. August,
Shubhendu S. Mukherjee:
Software-controlled fault tolerance.
TACO 2(4): 366-396 (2005) |
2004 |
3 | EE | Neil Vachharajani,
Matthew J. Bridges,
Jonathan Chang,
Ram Rangan,
Guilherme Ottoni,
Jason A. Blome,
George A. Reis,
Manish Vachharajani,
David I. August:
RIFLE: An Architectural Framework for User-Centric Information-Flow Security.
MICRO 2004: 243-254 |
2003 |
2 | EE | Alain J. Martin,
Mika Nyström,
Karl Papadantonakis,
Paul I. Pénzes,
Piyush Prakash,
Catherine G. Wong,
Jonathan Chang,
Kevin S. Ko,
Benjamin Lee,
Elaine Ou,
James Pugh,
Eino-Ville Talvala,
James T. Tong,
Ahmet Tura:
The Lutonium: A Sub-Nanojoule Asynchronous 8051 Microcontroller.
ASYNC 2003: 14-23 |
1996 |
1 | | Piero Franco,
Siyad C. Ma,
Jonathan Chang,
Yi-Chin Chu,
Sanjay Wattal,
Edward J. McCluskey,
Robert L. Stokes,
William D. Farwell:
Analysis and Detection of Timing Failures in an Experimental Test Chip.
ITC 1996: 691-700 |