| 2006 |
|---|
| 4 | EE | M. Ullán,
M. Lozano,
M. Chmeissani,
G. Blanchot,
Enric Cabruja,
J. García,
M. Maiorino,
R. Martínez,
G. Pellegrini,
C. Puigdengoles:
Test structure assembly for bump bond yield measurement on high density flip chip technologies.
Microelectronics Reliability 46(7): 1095-1100 (2006) |
| 3 | EE | M. Lozano,
José Martínez Sotoca,
José Salvador Sánchez,
Filiberto Pla,
Elzbieta Pekalska,
Robert P. W. Duin:
Experimental study on prototype optimisation algorithms for prototype-based classification in vector spaces.
Pattern Recognition 39(10): 1827-1838 (2006) |
| 2002 |
|---|
| 2 | EE | J. M. Rafí,
B. Vergnet,
F. Campabadal,
C. Fleta,
L. Fonseca,
M. Lozano,
C. Martínez,
M. Ullán:
Electrical characteristics of high-energy proton irradiated ultra-thin gate oxides.
Microelectronics Reliability 42(9-11): 1501-1504 (2002) |
| 2001 |
|---|
| 1 | EE | J. Barton,
G. McCarthy,
R. Doyle,
K. Delaney,
Enric Cabruja,
M. Lozano,
A. Collado,
J. Santander:
Reliability evaluation of a silicon-on-silicon MCM-D package.
Microelectronics Reliability 41(6): 887-899 (2001) |
