| |
| 2002 | ||
|---|---|---|
| 1 | EE | J. M. Rafí, B. Vergnet, F. Campabadal, C. Fleta, L. Fonseca, M. Lozano, C. Martínez, M. Ullán: Electrical characteristics of high-energy proton irradiated ultra-thin gate oxides. Microelectronics Reliability 42(9-11): 1501-1504 (2002) |
| 1 | F. Campabadal | [1] |
| 2 | L. Fonseca | [1] |
| 3 | M. Lozano | [1] |
| 4 | C. Martínez | [1] |
| 5 | J. M. Rafí | [1] |
| 6 | M. Ullán | [1] |
| 7 | B. Vergnet | [1] |