| |
| 2001 | ||
|---|---|---|
| 1 | EE | J. Barton, G. McCarthy, R. Doyle, K. Delaney, Enric Cabruja, M. Lozano, A. Collado, J. Santander: Reliability evaluation of a silicon-on-silicon MCM-D package. Microelectronics Reliability 41(6): 887-899 (2001) |
| 1 | J. Barton | [1] |
| 2 | Enric Cabruja | [1] |
| 3 | A. Collado | [1] |
| 4 | K. Delaney | [1] |
| 5 | R. Doyle | [1] |
| 6 | M. Lozano | [1] |
| 7 | G. McCarthy | [1] |