| |
| 2005 | ||
|---|---|---|
| 2 | EE | Yung-Huei Lee, Steve Jacobs, Stefan Stadler, Neal Mielke, Ramez Nachman: The impact of PMOST bias-temperature degradation on logic circuit reliability performance. Microelectronics Reliability 45(1): 107-114 (2005) |
| 2001 | ||
| 1 | EE | Yung-Huei Lee, Tom Linton, Ken Wu, Neal Mielke: Effect of trench edge on pMOSFET reliability. Microelectronics Reliability 41(5): 689-696 (2001) |
| 1 | Steve Jacobs | [2] |
| 2 | Tom Linton | [1] |
| 3 | Neal Mielke | [1] [2] |
| 4 | Ramez Nachman | [2] |
| 5 | Stefan Stadler | [2] |
| 6 | Ken Wu | [1] |