Ken Wu
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2001
1
EE
Yung-Huei Lee
,
Tom Linton
, Ken Wu,
Neal Mielke
: Effect of trench edge on pMOSFET reliability.
Microelectronics Reliability 41
(5): 689-696 (2001)
Coauthor
Index
1
Yung-Huei Lee
[
1
]
2
Tom Linton
[
1
]
3
Neal Mielke
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
