| 2008 |
|---|
| 10 | EE | Tian Chen,
Huaguo Liang,
Minsheng Zhang,
Wei Wang:
A Scheme of Test Pattern Generation Based on Reseeding of Segment-Fixing Counter.
ICYCS 2008: 2272-2277 |
| 2007 |
|---|
| 9 | EE | Wenfa Zhan,
Huaguo Liang,
Feng Shi,
Zhengfeng Huang:
A Novel Collaborative Scheme of Test Data Compression Based on Fixed-Plus-variable-Length Coding.
CSCWD 2007: 1044-1049 |
| 8 | EE | Wenfa Zhan,
Huaguo Liang,
Feng Shi,
Zhengfeng Huang:
Test data compression scheme based on variable-to-fixed-plus-variable-length coding.
Journal of Systems Architecture 53(11): 877-887 (2007) |
| 2005 |
|---|
| 7 | EE | Huaguo Liang,
Maoxiang Yi,
Xiangsheng Fang,
Cuiyun Jiang:
A BIST Scheme Based on Selecting State Generation of Folding Counters.
Asian Test Symposium 2005: 144-149 |
| 2003 |
|---|
| 6 | EE | Huaguo Liang,
Cuiyun Jiang:
Sharing BIST with Multiple Cores for System-on-a-Chip.
Asian Test Symposium 2003: 418-423 |
| 2002 |
|---|
| 5 | EE | Huaguo Liang,
Sybille Hellebrand,
Hans-Joachim Wunderlich:
A Mixed-Mode BIST Scheme Based on Folding Compression.
J. Comput. Sci. Technol. 17(2): 203-212 (2002) |
| 4 | EE | Huaguo Liang,
Sybille Hellebrand,
Hans-Joachim Wunderlich:
Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST.
J. Electronic Testing 18(2): 159-170 (2002) |
| 2001 |
|---|
| 3 | | Huaguo Liang,
Sybille Hellebrand,
Hans-Joachim Wunderlich:
Two-dimensional test data compression for scan-based deterministic BIST.
ITC 2001: 894-902 |
| 2 | EE | Sybille Hellebrand,
Huaguo Liang,
Hans-Joachim Wunderlich:
A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters.
J. Electronic Testing 17(3-4): 341-349 (2001) |
| 2000 |
|---|
| 1 | | Sybille Hellebrand,
Hans-Joachim Wunderlich,
Huaguo Liang:
A mixed mode BIST scheme based on reseeding of folding counters.
ITC 2000: 778-784 |
