Minsheng Zhang
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2008
1
EE
Tian Chen
,
Huaguo Liang
, Minsheng Zhang,
Wei Wang
: A Scheme of Test Pattern Generation Based on Reseeding of Segment-Fixing Counter.
ICYCS 2008
: 2272-2277
Coauthor
Index
1
Tian Chen
[
1
]
2
Huaguo Liang
[
1
]
3
Wei Wang
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
