2006 |
5 | EE | Dragica Vasileska,
Santhosh Krishnan,
Massimo V. Fischetti:
Examining Performance Enhancement of p-Channel Strained-SiGe MOSFET Devices.
Numerical Methods and Applications 2006: 189-196 |
4 | EE | Wilfried Haensch,
Edward J. Nowak,
Robert H. Dennard,
Paul M. Solomon,
Andres Bryant,
Omer H. Dokumaci,
Arvind Kumar,
Xinlin Wang,
Jeffrey B. Johnson,
Massimo V. Fischetti:
Silicon CMOS devices beyond scaling.
IBM Journal of Research and Development 50(4-5): 339-362 (2006) |
2005 |
3 | EE | Santhosh Krishnan,
Dragica Vasileska,
Massimo V. Fischetti:
Hole transport in p-channel Si MOSFETs.
Microelectronics Journal 36(3-6): 323-326 (2005) |
2001 |
2 | | J. C. Tsang,
Massimo V. Fischetti:
Why hot carrier emission based timing probes will work for 50 nm, 1V CMOS technologies.
Microelectronics Reliability 41(9-10): 1465-1470 (2001) |
1992 |
1 | | Wai Lee,
Steven E. Laux,
Massimo V. Fischetti,
Giorgio Baccarani,
Antonio Gnudi,
Johannes M. C. (Hans) Stork,
Jack A. Mandelman,
Emmanuel F. Crabbé,
Matthew R. Wordeman,
Farouk Odeh:
Numerical modeling of advanced semiconductor devices.
IBM Journal of Research and Development 36(2): 208-232 (1992) |