| 2001 |
|---|
| 9 | EE | N. Kurosawa,
H. Kobayashi,
K. Kobayashi:
Channel linearity mismatch effects in time-interleaved ADC systems.
ISCAS (1) 2001: 420-423 |
| 8 | EE | A. Teramoto,
H. Umeda,
K. Azamawari,
K. Kobayashi,
K. Shiga,
J. Komori,
Y. Ohno,
A. Shigetomi:
Time-dependent dielectric breakdown of SiO2 films in a wide electric field range.
Microelectronics Reliability 41(1): 47-52 (2001) |
| 7 | EE | H. Ohyama,
E. Simoen,
S. Kuroda,
C. Claeys,
Y. Takami,
T. Hakata,
K. Kobayashi,
M. Nakabayashi,
H. Sunaga:
Degradation and recovery of AlGaAs/GaAs p-HEMT irradiated by high-energy particle.
Microelectronics Reliability 41(1): 79-85 (2001) |
| 6 | | M. Nakabayashi,
H. Ohyama,
E. Simoen,
M. Ikegami,
C. Claeys,
K. Kobayashi,
M. Yoneoka,
K. Miyahara:
Reliability of polycrystalline silicon thin film resistors.
Microelectronics Reliability 41(9-10): 1341-1346 (2001) |
| 5 | | H. Ohyama,
M. Nakabayashi,
E. Simoen,
C. Claeys,
T. Tanaka,
T. Hirao,
S. Onada,
K. Kobayashi:
Radiation damages of polycrystalline silicon films and npn Si transistors by high-energy particle irradiation.
Microelectronics Reliability 41(9-10): 1443-1448 (2001) |
| 2000 |
|---|
| 4 | | K. Kobayashi,
Y. Takahashi:
Overflow probability for a discrete-time queue with non-stationary multiplexed input.
Telecommunication Systems 15(1-2): 157-166 (2000) |
| 1998 |
|---|
| 3 | | K. Kobayashi,
M. Fujii,
M. Hayamizu,
K. Ujihara:
Data Sharing of Shape Model with VRML Environment.
PROLAMAT 1998: 187-194 |
| 1997 |
|---|
| 2 | | K. Kobayashi,
Y. Takahashi:
Tail probability of a Gaussian fluid queue under finite measurement of input processes.
PMCCN 1997: 43-58 |
| 1995 |
|---|
| 1 | | K. Kobayashi,
Y. Takahashi:
Steady-State Analysis of ATM Multiplexer with Variable Input Rate Through Diffusion Approximation.
Perform. Eval. 23(2): 163-184 (1995) |
