| 2001 |
|---|
| 3 | EE | H. Ohyama,
E. Simoen,
S. Kuroda,
C. Claeys,
Y. Takami,
T. Hakata,
K. Kobayashi,
M. Nakabayashi,
H. Sunaga:
Degradation and recovery of AlGaAs/GaAs p-HEMT irradiated by high-energy particle.
Microelectronics Reliability 41(1): 79-85 (2001) |
| 2 | | M. Nakabayashi,
H. Ohyama,
E. Simoen,
M. Ikegami,
C. Claeys,
K. Kobayashi,
M. Yoneoka,
K. Miyahara:
Reliability of polycrystalline silicon thin film resistors.
Microelectronics Reliability 41(9-10): 1341-1346 (2001) |
| 1 | | H. Ohyama,
M. Nakabayashi,
E. Simoen,
C. Claeys,
T. Tanaka,
T. Hirao,
S. Onada,
K. Kobayashi:
Radiation damages of polycrystalline silicon films and npn Si transistors by high-energy particle irradiation.
Microelectronics Reliability 41(9-10): 1443-1448 (2001) |
