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A. Teramoto

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2001
1EEA. Teramoto, H. Umeda, K. Azamawari, K. Kobayashi, K. Shiga, J. Komori, Y. Ohno, A. Shigetomi: Time-dependent dielectric breakdown of SiO2 films in a wide electric field range. Microelectronics Reliability 41(1): 47-52 (2001)

Coauthor Index

1K. Azamawari [1]
2K. Kobayashi [1]
3J. Komori [1]
4Y. Ohno [1]
5K. Shiga [1]
6A. Shigetomi [1]
7H. Umeda [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)