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| 2001 | ||
|---|---|---|
| 1 | EE | H. Ohyama, E. Simoen, S. Kuroda, C. Claeys, Y. Takami, T. Hakata, K. Kobayashi, M. Nakabayashi, H. Sunaga: Degradation and recovery of AlGaAs/GaAs p-HEMT irradiated by high-energy particle. Microelectronics Reliability 41(1): 79-85 (2001) |
| 1 | C. Claeys | [1] |
| 2 | K. Kobayashi | [1] |
| 3 | S. Kuroda | [1] |
| 4 | M. Nakabayashi | [1] |
| 5 | H. Ohyama | [1] |
| 6 | E. Simoen | [1] |
| 7 | H. Sunaga | [1] |
| 8 | Y. Takami | [1] |