| |
| 2001 | ||
|---|---|---|
| 1 | M. Nakabayashi, H. Ohyama, E. Simoen, M. Ikegami, C. Claeys, K. Kobayashi, M. Yoneoka, K. Miyahara: Reliability of polycrystalline silicon thin film resistors. Microelectronics Reliability 41(9-10): 1341-1346 (2001) | |
| 1 | C. Claeys | [1] |
| 2 | K. Kobayashi | [1] |
| 3 | K. Miyahara | [1] |
| 4 | M. Nakabayashi | [1] |
| 5 | H. Ohyama | [1] |
| 6 | E. Simoen | [1] |
| 7 | M. Yoneoka | [1] |