2001 | ||
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1 | EE | H. Ohyama, E. Simoen, S. Kuroda, C. Claeys, Y. Takami, T. Hakata, K. Kobayashi, M. Nakabayashi, H. Sunaga: Degradation and recovery of AlGaAs/GaAs p-HEMT irradiated by high-energy particle. Microelectronics Reliability 41(1): 79-85 (2001) |
1 | C. Claeys | [1] |
2 | T. Hakata | [1] |
3 | K. Kobayashi | [1] |
4 | S. Kuroda | [1] |
5 | M. Nakabayashi | [1] |
6 | H. Ohyama | [1] |
7 | E. Simoen | [1] |
8 | Y. Takami | [1] |