| |
| 2001 | ||
|---|---|---|
| 1 | H. Ohyama, M. Nakabayashi, E. Simoen, C. Claeys, T. Tanaka, T. Hirao, S. Onada, K. Kobayashi: Radiation damages of polycrystalline silicon films and npn Si transistors by high-energy particle irradiation. Microelectronics Reliability 41(9-10): 1443-1448 (2001) | |
| 1 | C. Claeys | [1] |
| 2 | T. Hirao | [1] |
| 3 | K. Kobayashi | [1] |
| 4 | M. Nakabayashi | [1] |
| 5 | H. Ohyama | [1] |
| 6 | E. Simoen | [1] |
| 7 | T. Tanaka | [1] |