Manjul Bhushan
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2006
1
EE
Mark B. Ketchen
, Manjul Bhushan: Product-representative 'at speed' test structures for CMOS characterization.
IBM Journal of Research and Development 50
(4-5): 451-468 (2006)
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Mark B. Ketchen
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
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