Michael Peter Kennedy

2007
18	EE	Zhipeng Ye, Wenbin Chen, Michael Peter Kennedy: Modeling and Simulation of Delta-Sigma Fractional-N PLL Frequency Synthesizer in Verilog-AMS. IEICE Transactions 90-A(10): 2141-2147 (2007)
17	EE	Carsten Wegener, Michael Peter Kennedy: Hard-Fault Detection and Diagnosis During the Application of Model-Based Data Converter Testing. J. Electronic Testing 23(6): 513-525 (2007)
2006
16	EE	Zhipeng Ye, Tao Xu, Michael Peter Kennedy: Locking range analysis for injection-locked frequency dividers. ISCAS 2006
15	EE	D. Murphy, Michael Peter Kennedy, J. Buckley, Min Qu: The optimum power conversion efficiency and associated gain of an LC CMOS oscillator. ISCAS 2006
14	EE	Carsten Wegener, Michael Peter Kennedy: Test Development Through Defect and Test Escape Level Estimation for Data Converters. J. Electronic Testing 22(4-6): 313-324 (2006)
2005
13	EE	Peadar Forbes, Sarah Boyle, Keith O'Donoghue, Michael Peter Kennedy: On the Approximate One-d Map in Chua's oscillator. I. J. Bifurcation and Chaos 15(8): 2545-2550 (2005)
12	EE	Keith O'Donoghue, Michael Peter Kennedy, Peadar Forbes, Min Qu, Stephanie Jones: A Fast and Simple Implementation of Chua's oscillator with cubic-like Nonlinearity. I. J. Bifurcation and Chaos 15(9): 2959-2971 (2005)
11	EE	Carsten Wegener, Michael Peter Kennedy: Overcoming Test Setup Limitations by Applying Model-Based Testing to High-Precision ADCs. J. Electronic Testing 21(3): 299-310 (2005)
2003
10	EE	Carsten Wegener, Michael Peter Kennedy: Linear Model-Based Error Identification and Calibration for Data Converters. DATE 2003: 10630-10635
9	EE	Gwenolé Maugard, Carsten Wegener, Tom O'Dwyer, Michael Peter Kennedy: Method of reducing contactor effect when testing high-precision ADCs. ITC 2003: 210-217
2002
8	EE	Carsten Wegener, Michael Peter Kennedy: Implementation of Model-Based Testing for Medium to High-Resolution Nyquist-Rate ADCs. ITC 2002: 851-860
2001
7	EE	Géza Kolumbán, Michael Peter Kennedy: Recent results for chaotic modulation schemes. ISCAS (3) 2001: 141-144
6	EE	Carsten Wegener, Michael Peter Kennedy, Bernd Straube: Process Deviations and Spot Defects: Two Aspects of Test and Test Development for Mixed-Signal Circuits. J. Electronic Testing 17(5): 409-416 (2001)
2000
5	EE	Carsten Wegener, Michael Peter Kennedy: Incorporation of Hard-Fault-Coverage in Model-Based Testing of Mixed-Signal ICs. DATE 2000: 765
4	EE	Michael Peter Kennedy, Géza Kolumbán: Digital communications using chaos. Signal Processing 80(7): 1307-1320 (2000)
1999
3	EE	P. Acco, Michael Peter Kennedy, C. Mira, B. Morley, B. Frigyik: Behavioral modeling of charge pump phase locked loops. ISCAS (1) 1999: 375-378
2	EE	Géza Kolumbán, Z. Jako, Michael Peter Kennedy: Enhanced versions of DCSK and FM-DCSK data transmission systems. ISCAS (4) 1999: 475-478
1	EE	Michael Peter Kennedy, Géza Kolumbán, Gábor Kis: Simulation of the multipath performance of FM-DCSK digital communications using chaos. ISCAS (4) 1999: 568-571

Coauthor Index

1	P. Acco	[3]
2	Sarah Boyle	[13]
3	J. Buckley	[15]
4	Wenbin Chen	[18]
5	Peadar Forbes	[12] [13]
6	B. Frigyik	[3]
7	Z. Jako	[2]
8	Stephanie Jones	[12]
9	Gábor Kis	[1]
10	Géza Kolumbán	[1] [2] [4] [7]
11	Gwenolé Maugard	[9]
12	C. Mira	[3]
13	B. Morley	[3]
14	D. Murphy	[15]
15	Keith O'Donoghue	[12] [13]
16	Tom O'Dwyer	[9]
17	Min Qu	[12] [15]
18	Bernd Straube	[6]
19	Carsten Wegener	[5] [6] [8] [9] [10] [11] [14] [17]
20	Tao Xu	[16]
21	Zhipeng Ye	[16] [18]

Colors in the list of coauthors