| 2007 |
|---|
| 8 | EE | Carsten Wegener,
Michael Peter Kennedy:
Hard-Fault Detection and Diagnosis During the Application of Model-Based Data Converter Testing.
J. Electronic Testing 23(6): 513-525 (2007) |
| 2006 |
|---|
| 7 | EE | Carsten Wegener,
Michael Peter Kennedy:
Test Development Through Defect and Test Escape Level Estimation for Data Converters.
J. Electronic Testing 22(4-6): 313-324 (2006) |
| 2005 |
|---|
| 6 | EE | Carsten Wegener,
Michael Peter Kennedy:
Overcoming Test Setup Limitations by Applying Model-Based Testing to High-Precision ADCs.
J. Electronic Testing 21(3): 299-310 (2005) |
| 2003 |
|---|
| 5 | EE | Carsten Wegener,
Michael Peter Kennedy:
Linear Model-Based Error Identification and Calibration for Data Converters.
DATE 2003: 10630-10635 |
| 4 | EE | Gwenolé Maugard,
Carsten Wegener,
Tom O'Dwyer,
Michael Peter Kennedy:
Method of reducing contactor effect when testing high-precision ADCs.
ITC 2003: 210-217 |
| 2002 |
|---|
| 3 | EE | Carsten Wegener,
Michael Peter Kennedy:
Implementation of Model-Based Testing for Medium to High-Resolution Nyquist-Rate ADCs.
ITC 2002: 851-860 |
| 2001 |
|---|
| 2 | EE | Carsten Wegener,
Michael Peter Kennedy,
Bernd Straube:
Process Deviations and Spot Defects: Two Aspects of Test and Test Development for Mixed-Signal Circuits.
J. Electronic Testing 17(5): 409-416 (2001) |
| 2000 |
|---|
| 1 | EE | Carsten Wegener,
Michael Peter Kennedy:
Incorporation of Hard-Fault-Coverage in Model-Based Testing of Mixed-Signal ICs.
DATE 2000: 765 |
