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Tom O'Dwyer

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2003
1EEGwenolé Maugard, Carsten Wegener, Tom O'Dwyer, Michael Peter Kennedy: Method of reducing contactor effect when testing high-precision ADCs. ITC 2003: 210-217

Coauthor Index

1Michael Peter Kennedy [1]
2Gwenolé Maugard [1]
3Carsten Wegener [1]

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