Tom O'Dwyer
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2003
1
EE
Gwenolé Maugard
,
Carsten Wegener
, Tom O'Dwyer,
Michael Peter Kennedy
: Method of reducing contactor effect when testing high-precision ADCs.
ITC 2003
: 210-217
Coauthor
Index
1
Michael Peter Kennedy
[
1
]
2
Gwenolé Maugard
[
1
]
3
Carsten Wegener
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)