Leon van de Logt

2007
3	EE	Shaji Krishnan, Rene Jonker, Leon van de Logt: Variance Reduction for Supply Ramp Based Cheap RF Test Alternatives. European Test Symposium 2007: 55-62
2003
2	EE	Frans de Jong, Leon van de Logt: IEEE P1581: To Live or Let die? ITC 2003: 1278
1	EE	Leon van de Logt, Frank van der Heyden, Tom Waayers: An extension to JTAG for at-speed debug on a system. ITC 2003: 785-792

Coauthor Index

1	Frank van der Heyden	[1]
2	Frans de Jong	[2]
3	Rene Jonker	[3]
4	Shaji Krishnan	[3]
5	Tom Waayers	[1]

Colors in the list of coauthors