Rodger Schuttert

2004
4	EE	Rodger Schuttert, D. C. L. Van Geest, A. Kumar: On-Chip Mixed-Signal Test Structures Re-used for Board Test. ITC 2004: 375-383
2002
3	EE	Rodger Schuttert, Frans de Jong, Ben Kup: Improved Test Monitor Circuit in Power Pin DfT. VTS 2002: 345-350
2000
2		Frans de Jong, Ben Kup, Rodger Schuttert: Power pin testing: making the test coverage complete. ITC 2000: 575-584
1998
1	EE	Alex S. Biewenga, Math Muris, Rodger Schuttert, Urs Fawer: Testing a multichip package for a consumer communications application. ITC 1998: 222-227

Coauthor Index

1	Alex S. Biewenga	[1]
2	Urs Fawer	[1]
3	D. C. L. Van Geest	[4]
4	Frans de Jong	[2] [3]
5	A. Kumar	[4]
6	Ben Kup	[2] [3]
7	Math Muris	[1]

Colors in the list of coauthors