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Rodger Schuttert

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2004
4EERodger Schuttert, D. C. L. Van Geest, A. Kumar: On-Chip Mixed-Signal Test Structures Re-used for Board Test. ITC 2004: 375-383
2002
3EERodger Schuttert, Frans de Jong, Ben Kup: Improved Test Monitor Circuit in Power Pin DfT. VTS 2002: 345-350
2000
2 Frans de Jong, Ben Kup, Rodger Schuttert: Power pin testing: making the test coverage complete. ITC 2000: 575-584
1998
1EEAlex S. Biewenga, Math Muris, Rodger Schuttert, Urs Fawer: Testing a multichip package for a consumer communications application. ITC 1998: 222-227

Coauthor Index

1Alex S. Biewenga [1]
2Urs Fawer [1]
3D. C. L. Van Geest [4]
4Frans de Jong [2] [3]
5A. Kumar [4]
6Ben Kup [2] [3]
7Math Muris [1]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)