| |
| 2002 | ||
|---|---|---|
| 2 | EE | Rodger Schuttert, Frans de Jong, Ben Kup: Improved Test Monitor Circuit in Power Pin DfT. VTS 2002: 345-350 |
| 2000 | ||
| 1 | Frans de Jong, Ben Kup, Rodger Schuttert: Power pin testing: making the test coverage complete. ITC 2000: 575-584 | |
| 1 | Frans de Jong | [1] [2] |
| 2 | Rodger Schuttert | [1] [2] |