2008 |
12 | EE | Jin-Hua Hong,
Wen-Jie Li:
A Novel and Scalable RSA Cryptosystem Based on 32-Bit Modular Multiplier.
ISVLSI 2008: 483-486 |
11 | EE | Chung-Yi Li,
Chih-Feng Chien,
Jin-Hua Hong,
Tsin-Yuan Chang:
An Efficient Area-Delay Product Design for MixColumns/InvMixColumns in AES.
ISVLSI 2008: 503-506 |
2006 |
10 | EE | Jin-Hua Hong,
Bin-Yan Tsai:
A Fast Bit-Interleaving RSA Cryptosystem Based on Radix-4 Cellular-Array Modular Multiplier.
APCCAS 2006: 1446-1449 |
2004 |
9 | | Jin-Hua Hong,
Bin-Yan Tsai,
Liang-Te Lu,
Shao-Hui Shieh:
A novel radix-4 bit-level modular multiplier for fast RSA cryptosystem.
ISCAS (2) 2004: 837-840 |
2003 |
8 | EE | Shao-Sheng Yang,
Pao-Lin Guo,
Tsin-Yuan Chang,
Jin-Hua Hong:
A multi-phase charge-sharing technique without external capacitor for low-power TFT-LCD column drivers.
ISCAS (5) 2003: 365-368 |
7 | EE | Jin-Hua Hong,
Cheng-Wen Wu:
Cellular-array modular multiplier for fast RSA public-key cryptosystem based on modified Booth's algorithm.
IEEE Trans. VLSI Syst. 11(3): 474-484 (2003) |
2001 |
6 | EE | Chung-Hsien Wu,
Jin-Hua Hong,
Cheng-Wen Wu:
RSA cryptosystem design based on the Chinese remainder theorem.
ASP-DAC 2001: 391-395 |
5 | EE | Chung-Hsien Wu,
Jin-Hua Hong,
Cheng-Wen Wu:
VLSI Design of RSA Cryptosystem Based on the Chinese Remainder Theorem.
J. Inf. Sci. Eng. 17(6): 967-980 (2001) |
2000 |
4 | EE | Jin-Hua Hong,
Cheng-Wen Wu:
Radix-4 modular multiplication and exponentiation algorithms for the RSA public-key cryptosystem.
ASP-DAC 2000: 565-570 |
3 | EE | Jin-Hua Hong,
Chung-Hung Tsai,
Cheng-Wen Wu:
Hierarchical system test by an IEEE 1149.5 MTM-bus slave-module interface core.
IEEE Trans. VLSI Syst. 8(5): 503-516 (2000) |
1998 |
2 | EE | Shih-Arn Hwang,
Jin-Hua Hong,
Cheng-Wen Wu:
Sequential circuit fault simulation using logic emulation.
IEEE Trans. on CAD of Integrated Circuits and Systems 17(8): 724-736 (1998) |
1996 |
1 | EE | Jin-Hua Hong,
Chung-Hung Tsai,
Cheng-Wen Wu:
Hierarchical Testing Using the IEEE Std 1149.5 Module Test and Maintenance Slave Interface Module.
Asian Test Symposium 1996: 50-55 |