| 2005 |
|---|
| 7 | EE | Cezary Sydlo,
J. Sigmund,
Bastian Mottet,
Hans L. Hartnagel:
Reliability investigations on LTG-GaAs photomixers for THz generation based on optical heterodyning.
Microelectronics Reliability 45(9-11): 1600-1604 (2005) |
| 2003 |
|---|
| 6 | EE | Cezary Sydlo,
K. Mutamba,
L. Divac Krnic,
Bastian Mottet,
Hans L. Hartnagel:
Reliability studies on integrated GaAs power-sensor structures using pulsed electrical stress.
Microelectronics Reliability 43(9-11): 1929-1933 (2003) |
| 2002 |
|---|
| 5 | EE | Cezary Sydlo,
M. Saglam,
Bastian Mottet,
M. Rodríguez-Gironés,
Hans L. Hartnagel:
Reliability investigations on HBV using pulsed electrical stress.
Microelectronics Reliability 42(9-11): 1563-1568 (2002) |
| 4 | EE | V. Ichizli,
M. Rodríguez-Gironés,
L. Marchand,
C. Garden,
O. Cojocari,
Bastian Mottet,
Hans L. Hartnagel:
Process Control and Failure Analysis Implementation for THz Schottky-based components.
Microelectronics Reliability 42(9-11): 1593-1596 (2002) |
| 2001 |
|---|
| 3 | | Cezary Sydlo,
Bastian Mottet,
Husin Ganis,
Hans L. Hartnagel,
Viktor Krozer,
S. L. Delage,
Simone Cassette,
Eric Chartier,
D. Floriot,
Steven Bland:
Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT.
Microelectronics Reliability 41(9-10): 1567-1571 (2001) |
| 1996 |
|---|
| 2 | EE | Lutz J. Micheel,
Hans L. Hartnagel:
Interband RTDs with Nanoelectronic HBT-LED Structures for Multiple-Valued Computation.
ISMVL 1996: 80-85 |
| 1994 |
|---|
| 1 | | Lutz J. Micheel,
Hans L. Hartnagel,
Wallace T. Anderson,
Stephen W. Kirchoefer,
Nicolas A. Papanicolaou:
Interband-Tunneling III-V Semiconductor Structures for Multiple-Valued Literal and Arithmetic Functions.
ISMVL 1994: 198-206 |
